LEA-S500® Elemental Analyzer

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The types of analysis that require essential material and time costs if other methods of analysis are used, are considered.

 

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. fig1 trubka 320x250

The inclusion in a tube made of medical glass (photo)

SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. fig2 trubka-monitor 320x250

The inclusion in a tube made of a medical glass
(monitor view), х100

Defectoscopy.
Analysis of inclusions and structural components
 
Material defect is a local change of chemical composition of the material affecting the properties of the material
Flaw (defect) detection is performed by means of comparison of pure glass spectra and the spectra of a defect. The positioning system of the LEA-S500 provides the pointing accuracy of 1 µm. For a qualitative analysis size of defect should be not less than 5 µm and for a quantitative analysis size of defect should be not less than 150 µm.
In the given case the zirconium inclusion indicates the destruction of the refractory laying in a glass-making furnace.
Diagnostics of destruction processes at initial stage allows to take preventive measures and to avoid expensive reconstructions. Time of analysis is about 2 min.

 
SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. spektr def chist stek eng
 
The spectrum of the defect and the pure glass
 

 

Distribution of elements over the surface, homogeneity control

The control of elements distribution over the material surface provides new information about the analyzed samples. LEA-S500 allows high accurate, fast and low cost analysis. It also allows to analyze materials with a step of 100 µm.
This type of the analysis is recommended for specification of homogeneity specification at the certification of composition of reference materials.
 
SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. fig4 map koncentr LEA 320x250
Concentration map of the element on the sample surface
 

 

Layer-by-layer analysis

Successive evaporation of sample material with the focused laser pulses provides elemental (chemical) analysis of composition and thickness of multi-layer coatings and thin films. Deposits, corrosion areas, sections with the damaged structure, composite materials, etc. can be investigated.
 
 
 
SOL instruments: спектрометр, рамановский микроскоп, эмиссионный спектрометр. fig5 zerk poverh LEA 320x250

Analysis of the mirror surface with minimal path of 2х2 mm, 400 points