LEA-S500
Description
LIBS method
Capabilities
Applications
Measurement procedures
Publications

Laser elemental analyzer LEA-S500 permits chemical analysis of any solid-state samples without re-configuration of the equipment. The change of a sample type for analysis takes several seconds.

Multi-element quantitative sample analysis including sample preparation takes from 1 to 15 minutes.

Qualitative analysis – 50 elements per 5 minutes.

Analysis of any solid-state or powder materials: ceramics, glass, cement; metals and alloys; slags; rubbers, caoutchoucs, plastics; micro-elements and admixtures in pure materials; chemical agents; ores, minerals and mono-mineral inclusions; natural materials (clays, sands, dolomite, soda, salt and etc.); ash of herbal and animal origin; wooden materials; solid residue of liquids; frozen liquids; soil; dry plant materials; and other materials.

The detection limits of chemical elements for LEA-S500 analyzer

LEA-S500: element detection limits
Mendeleev table with established detection limits for LEA‑S500

Detection limit means a minimal content of the element in a sample, detected with the instrument.

Usually a concentration, at which the analytical signal detected with the instrument equals to a triple value of a standard deviation of noise signal, is taken for a detection limit. Obtaining of such signal is a sufficient reason for making a decision on presence of the searched component.

Detection limit is a parameter sensitive to measurement conditions and a sample characteristic.

Advantages of the laser elemental analyzer LEA-S500

Advantages of analyzer LEA-S500
  • Measuring of mass fraction (concentration) of chemical elements or their compounds (oxides) in a sample with minimal sample preparation before investigation;
  • Express multi-element analysis of chemical composition per one measurement;
  • High sensitive and precise measurements in the wide concentration range;
  • No change of a sample aggregate state;
  • Sample analysis in the set points (areas) on the surface by means of positioning system and video surveillance;
  • No need in ultrapure reagents for a sample preparation; no need in expensive consumables;
  • No need in inert gas to solve most of the tasks;
  • Dirty sample surface is cleaned with the preliminary laser pulses;
  • Versatility: no need in re-configuration or modernization of the instrument to solve all the mentioned tasks;
  • Analysis of conductive and non-conductive materials; analysis of a wire of any diameter, balls, cylindrical details without additional processing using special adapters (included in the delivery set);
  • Uncompromising operation safety, complete protection of the personnel from harmful factors.

Software ATILLA 2 for working with elemental analyzer LEA-S500

ATILLA 2 is a powerful intuitive software instrument for the instrument control and measurements automation.

ATILLA 2 contains:

  • Spectral lines database
  • Certified reference materials database
  • Analyzed samples database (archive)
MORE about ATILLA 2

ATILLA 2 provides:

  • Automatic sample analysis
  • Calibration and re-calibration
  • Graphical imaging of the obtained spectrum
  • Sample surface observation, selection of any point or area for the analysis
  • Possibility for development of analytical programs by a user (selection of spectra excitation and detection modes, selection of algorithms of spectral lines mathematical processing, calibration of the instrument)
  • Control of quality and reliability of the analysis results
  • Printing out the analysis results and their mathematical processing
  • Memory storage of unlimited number of analytical programs
  • Control over the instrument and the system state
  • Auto-calibration of a wavelength scale

Sample preparation for the laser elemental analyzer LEA-S500

  • For analysis of solid-state, monolith materials (metals, alloys, glass, ceramics and etc.) no sample preparation is required or it lies in the obtaining of a plane section of a sample surface.
  • For analysis of a transparent sample (glass, crystal) the area of analysis is additionally polished.
  • For the analysis of powdery samples (refractory components, slags, concentrates, sands, ash, etc.) the materials are ground with the subsequent pressing in tablets.
  • Sample preparation of powder-state materials takes:

    • with manual tools – 10-40 minutes;
    • with the help of semi-automatic tools – 3-5 minutes.
  • 100 mg of a sample material is enough for the preparation of a tablet.
Sample preparation: metal samples

Other capabilities of the laser elemental analyzer LEA-S500

This section considers other types of analysis that require essential material and time costs if other methods of analysis, not involving the elemental analyzer, are used.

The inclusion in a tube made of medical glass (photo)
The inclusion in a tube made of medical glass (photo)
The inclusion in a tube made of a medical glass (monitor view), х100
The inclusion in a tube made of a medical glass (monitor view), х100

Defectoscopy: analysis of inclusions and structural components

The spectrum of the defect and the pure glass
The spectrum of the defect and the pure glass

Material defect is a local change of chemical composition of the material affecting the properties of the material.

Flaw (defect) detection is performed by means of comparison of pure glass spectra and the spectra of a defect. The positioning system of the LEA-S500 provides the pointing accuracy of 1 µm. For a qualitative analysis size of defect should be not less than 5 µm and for a quantitative analysis size of defect should be not less than 150 µm. In the given case the zirconium inclusion indicates the destruction of the refractory laying in a glass-making furnace. Diagnostics of destruction processes at initial stage allows to take preventive measures and to avoid expensive reconstructions. Time of analysis is about 2 min.

Distribution of elements over the surface, homogeneity control

Concentration map of the element on the sample surface
Concentration map of the chemical element on the sample surface

The control of elements distribution over the material surface provides new information about the analyzed samples. LEA-S500 allows high accurate, fast and low cost analysis. It also allows to analyze materials with a step of 100 µm.

This type of the analysis is recommended for specification of homogeneity specification at the certification of composition of reference materials.

Layer-by-layer analysis

Analysis of the mirror surface with minimal path of 2х2 mm, 400 points
Analysis of the mirror surface with the minimal path of 2х2 mm, 400 points

Successive evaporation of sample material with the focused laser pulses provides elemental (chemical) analysis of chemical composition and thickness of multiple layer coatings and thin films.

Deposits, corrosion areas, sections with the damaged structure, composite materials, etc. can be investigated.