Graphene has a number of unique properties (hardness, significant thermal and electrical conductivity, optical transparency, chemical stability), which makes it interesting for many applications.
To optimize technology of Graphene production, the need for measurement techniques with the capability to characterize structures with the high spatial resolution. Raman spectroscopy and microscopy are good candidates to characterize Graphene. These measurement methods are realized in Confotec® MR520 (SOL instruments) confocal microscope. Raman spectroscopy and microscopy provide information about Graphene flake thickness, structural uniformity, etc.
In this document, we demonstrate the potential of Confotec® MR520 to Graphene analysis.