Features of laser Raman confocal microscope Confotec® NR500
- Simultaneous / multifunctional analysis:
- Raman measurements;
- Luminescent measurements;
- Laser Reflection and Transmission Measurements;
- 3D high-contrast images in reflected light;
- 3D Raman confocal measurements;
- Information about spectral and polarization propertis of a sample.
- Spatial resolution:
- horizontal up to 200 nm;
- axial up to 500 nm.
- Wide spectral range:
- 785 nm: spectral range 50 – 3700 cm-1;
- 633 nm: spectral range 60 – 6700 cm-1;
- 488 nm: spectral range 150 – 10000 cm-1.
Simultaneous use of up to 5 lasers by switching over the components inside the system.
The scanning system provides, alongside with point-to-point scanning, fast scanning (1000 x 1000 pixel per 3 seconds) of a specimen with PMT signal registration.
The scanning area: 130×130 µm.
- Specially designed monochromator-spectrograph with unique parameters:
- spectral resolution up to 0.006 nm;
- astigmatism less than 5 µm.
- Use of inverted and upright microscopes is possible..
- Telescope with variable magnification for adapting laser beams to entrance pupils of microobjectives from 3 to 12 mm.
- Polarized measurements.
- High sensitivity at low power of laser excitation (from µW to mW).
Reflection module for simultaneous obtaining of 3D image in reflected light.
- Transmission measurements option.
- Fully automated control of the system.
- High temporal and temperature stability is provided by modular rigid and rod design.
- No fiber optics that decrease some optical parameters (transmission, wave front, polarization).
- Ring illumination for combination with AFM.
Signal decrease from 90 % to 10 % at 200 nm, λ=514 nm, 100Х immersion lens.
Resolution along Z-axis. The reflection from silicon wafer, obtained by moving the objective lens along the Z axis. FW HW – 442 nm, λ=488 nm, 100x objective lens.
Specially designed monochromator-spectrograph with unique parameters: spectral resolution up to 0.006 nm, astigmatism less than 5 µm. Absolute wavelength accuracy: about 0.016 nm (for grating 2400 l/mm). Pinhole spectral image at CCD camera. Pixel size: 12 µm. Pinhole size: 12 µm. Size of spectral image: 1.5 pixel.
Raman spectrum of Si wafer. Si(4) peak is clearly detected. Si(1) and Si(2) are in deep saturation. Confocal mode. Accumulation time – 60 sec. 488 nm laser, 5 mW power.
Application areas of Raman confocal microscope Confotec® NR500
Study of physical properties of new carbonic nanomaterials such as graphene and nanotubes, determination of stress and deformation, estimation of structural order.
Investigation of physical structure and chemical composition of semiconductors, thin films and other materials and structures.
Studying the physical properties of new carbon nanomaterials, such as graphene and nanotubes, determining stresses and strains, assessing the ordering of the structure.
Identification of minerals, determination of phase composition and distribution over the sample; characterization of precious stones and determination of inclusions in them.
Non-destructive identification of different findings in the result of archeological excavations.
Non-destructive identification of pigments and undercoatings on pictures, icons, wall paintings, ceramics and other works of art.
Study of chemical reaction mechanisms.
Monitoring of coating technological processes, investigation of various polymer materials, including thin films.
Study of living cells cancerous pre-cancerous tissues, DNA, cytological investigations.
Determination of distribution of pharmaceutical ingredients in drugs, identification of raw materials, monitoring and controlling of drugs manufacturing processes.
Ointment, cream investigations as well as their penetration capability.
Identification of unknown substances, different types of fibers, glass, paints , explosive materials, narcotic and toxic substances.