Laser elemental analyzer LEA-S500 permits chemical analysis of any solid-state samples without re-configuration of the equipment. The change of a sample type for analysis takes several seconds.
Multi-element quantitative sample analysis including sample preparation takes from 1 to 15 minutes.
Qualitative analysis – 50 elements per 5 minutes.
Analysis of any solid-state or powder materials: ceramics, glass, cement; metals and alloys; slags; rubbers, caoutchoucs, plastics; micro-elements and admixtures in pure materials; chemical agents; ores, minerals and mono-mineral inclusions; natural materials (clays, sands, dolomite, soda, salt and etc.); ash of herbal and animal origin; wooden materials; solid residue of liquids; frozen liquids; soil; dry plant materials; and other materials.
The detection limits of chemical elements for LEA-S500 analyzer
Detection limit means a minimal content of the element in a sample, detected with the instrument.
Usually a concentration, at which the analytical signal detected with the instrument equals to a triple value of a standard deviation of noise signal, is taken for a detection limit. Obtaining of such signal is a sufficient reason for making a decision on presence of the searched component.
Detection limit is a parameter sensitive to measurement conditions and a sample characteristic.
Software ATILLA 2 for working with elemental analyzer LEA-S500
ATILLA 2 is a powerful intuitive software instrument for the instrument control and measurements automation.
ATILLA 2 contains:
- Spectral lines database
- Certified reference materials database
- Analyzed samples database (archive)
ATILLA 2 provides:
- Automatic sample analysis
- Calibration and re-calibration
- Graphical imaging of the obtained spectrum
- Sample surface observation, selection of any point or area for the analysis
- Possibility for development of analytical programs by a user (selection of spectra excitation and detection modes, selection of algorithms of spectral lines mathematical processing, calibration of the instrument)
- Control of quality and reliability of the analysis results
- Printing out the analysis results and their mathematical processing
- Memory storage of unlimited number of analytical programs
- Control over the instrument and the system state
Auto-calibration of a wavelength scale
Sample preparation for the laser elemental analyzer LEA-S500
- For analysis of solid-state, monolith materials (metals, alloys, glass, ceramics and etc.) no sample preparation is required or it lies in the obtaining of a plane section of a sample surface.
- For analysis of a transparent sample (glass, crystal) the area of analysis is additionally polished.
- For the analysis of powdery samples (refractory components, slags, concentrates, sands, ash, etc.) the materials are ground with the subsequent pressing in tablets.
- Sample preparation of powder-state materials takes:
- with manual tools – 10-40 minutes;
- with the help of semi-automatic tools – 3-5 minutes.
- 100 mg of a sample material is enough for the preparation of a tablet.
Other capabilities of the laser elemental analyzer LEA-S500
This section considers other types of analysis that require essential material and time costs if other methods of analysis, not involving the elemental analyzer, are used.
Defectoscopy: analysis of inclusions and structural components
The spectrum of the defect and the pure glass
Material defect is a local change of chemical composition of the material affecting the properties of the material.
Flaw (defect) detection is performed by means of comparison of pure glass spectra and the spectra of a defect. The positioning system of the LEA-S500 provides the pointing accuracy of 1 µm. For a qualitative analysis size of defect should be not less than 5 µm and for a quantitative analysis size of defect should be not less than 150 µm. In the given case the zirconium inclusion indicates the destruction of the refractory laying in a glass-making furnace. Diagnostics of destruction processes at initial stage allows to take preventive measures and to avoid expensive reconstructions. Time of analysis is about 2 min.
Distribution of elements over the surface, homogeneity control
Concentration map of the chemical element on the sample surface
The control of elements distribution over the material surface provides new information about the analyzed samples. LEA-S500 allows high accurate, fast and low cost analysis. It also allows to analyze materials with a step of 100 µm.
This type of the analysis is recommended for specification of homogeneity specification at the certification of composition of reference materials.
Layer-by-layer analysis
Analysis of the mirror surface with the minimal path of 2х2 mm, 400 points
Successive evaporation of sample material with the focused laser pulses provides elemental (chemical) analysis of chemical composition and thickness of multiple layer coatings and thin films.
Deposits, corrosion areas, sections with the damaged structure, composite materials, etc. can be investigated.