Laser elemental analyzer LEA-S500 permits chemical analysis of any solid-state samples without re-configuration of the equipment. The change of a sample type for analysis takes several seconds.
Multi-element quantitative sample analysis including sample preparation takes from 1 to 15 minutes.
Qualitative analysis – 50 elements per 5 minutes.
Analysis of any solid-state or powder materials: ceramics, glass, cement; metals and alloys; slags; rubbers, caoutchoucs, plastics; micro-elements and admixtures in pure materials; chemical agents; ores, minerals and mono-mineral inclusions; natural materials (clays, sands, dolomite, soda, salt and etc.); ash of herbal and animal origin; wooden materials; solid residue of liquids; frozen liquids; soil; dry plant materials; and other materials.
The detection limits of chemical elements for LEA-S500 analyzer
Mendeleev table with established detection limits for LEA‑S500
Detection limit means a minimal content of the element in a sample, detected with the instrument.
Usually a concentration, at which the analytical signal detected with the instrument equals to a triple value of a standard deviation of noise signal, is taken for a detection limit. Obtaining of such signal is a sufficient reason for making a decision on presence of the searched component.
Detection limit is a parameter sensitive to measurement conditions and a sample characteristic.
Advantages of the laser elemental analyzer LEA-S500
Software ATILLA 2 for working with elemental analyzer LEA-S500
ATILLA 2 is a powerful intuitive software instrument for the instrument control and measurements automation.
ATILLA 2 contains:
ATILLA 2 provides:
Sample preparation for the laser elemental analyzer LEA-S500
Other capabilities of the laser elemental analyzer LEA-S500
This section considers other types of analysis that require essential material and time costs if other methods of analysis, not involving the elemental analyzer, are used.
The inclusion in a tube made of medical glass (photo)
The inclusion in a tube made of a medical glass (monitor view), х100
Defectoscopy: analysis of inclusions and structural components
The spectrum of the defect and the pure glass
Material defect is a local change of chemical composition of the material affecting the properties of the material.
Flaw (defect) detection is performed by means of comparison of pure glass spectra and the spectra of a defect. The positioning system of the LEA-S500 provides the pointing accuracy of 1 µm. For a qualitative analysis size of defect should be not less than 5 µm and for a quantitative analysis size of defect should be not less than 150 µm. In the given case the zirconium inclusion indicates the destruction of the refractory laying in a glass-making furnace. Diagnostics of destruction processes at initial stage allows to take preventive measures and to avoid expensive reconstructions. Time of analysis is about 2 min.
Distribution of elements over the surface, homogeneity control
Concentration map of the chemical element on the sample surface
The control of elements distribution over the material surface provides new information about the analyzed samples. LEA-S500 allows high accurate, fast and low cost analysis. It also allows to analyze materials with a step of 100 µm.
This type of the analysis is recommended for specification of homogeneity specification at the certification of composition of reference materials.
Layer-by-layer analysis
Analysis of the mirror surface with the minimal path of 2х2 mm, 400 points
Successive evaporation of sample material with the focused laser pulses provides elemental (chemical) analysis of chemical composition and thickness of multiple layer coatings and thin films.
Deposits, corrosion areas, sections with the damaged structure, composite materials, etc. can be investigated.