Specification of monochromator-spectrograph MS750 • SOL instruments

Optical system

Optical scheme:	Cherny-Turner (astigmatism-compensated in models MS7501i and MS7504i)
Ports:	1 input, 2 output
Wavelength range:	185 nm – 60 µm (depends on the type of grating)
F/number (entrance):	1/8.9
Focal length (output):	750 mm
Scanning range limited by the grating rotation angle*:	0 – 1270 nm
Main mirrors:	spherical
Stray light:	5.5 х 10^-7 (20 nm from laser line 632.8 nm)
Focal plane:	28 х 10 mm

Optical scheme: Cherny-Turner (astigmatism-compensated in models MS7501i and MS7504i).
Ports: 1 input, 2 output.
Wavelength range: 185 nm — 60 µm (depends on the type of grating).
F/number (entrance): 1/8.9.
Focal length (output): 750 mm.
Scanning range limited by the grating rotation angle*: 0 — 1270 nm.
Main mirrors: spherical.
Stray light: 5.5 х 10^-7 (20 nm from laser line 632.8 nm).
Focal plane: 28 х 10 mm.

minimization of coma aberration over the whole operating spectral range of the device;
elimination of the light re-entrance from two basic mirrors;
elimination of the light re-entrance between mirrors of the instrument and input windows of the detectors in the focal plane;
a large plane focal field for the whole operating spectral range;
astigmatism compensation for the whole operating spectral range by means of special correcting optics (for imaging modifications MS7504i and MS7501i).

Model:	MS7501	MS7504	MS7501i	MS7504i
Horizontal magnification:	1.05	1.05	1.05	1.05
Vertical magnification:	–	–	1.125	1.125
Vertical spatial resolution:	–	–	< 15 µm	< 15 µm

Model MS7501: horizontal magnification = 1.05
Model MS7504: horizontal magnification = 1.05
Model MS7501i: horizontal magnification = 1.05; vertical magnification = 1.125; vertical spatial resolution less than 15 µm
Model MS7504i: horizontal magnification = 1.05; vertical magnification = 1.125; vertical spatial resolution less than 15 µm

Type of grating:	1200 l/mm, λ = 546 nm	Echelle, 75 l/mm, λ = 200 nm, 120 order
Reciprocal linear dispersion:	1.02 nm/mm	0.055 nm/mm
Spectral resolution:
PMT (slit width 10 µm):	0.015 nm	0.0008 nm
Digital camera (12 µm pixel, slit width 15 µm):	0.02 nm	0.0011 nm
Repeatability:	± 0.007 nm	± 0.0009 nm
Wavelength accuracy:	± 0.034 nm	± 0.0045 nm
Average scanning step:	0.0017 nm	–
Scanning step at 200 nm:	–	2.25 х 10^-4nm

Grating 1200 l/mm, λ = 546 nm: reciprocal linear dispersion = 1.02 nm/mm, spectral resolution of PMT (slit width 10 µm) = 0.015 nm, spectral resolution of digital camera (12 µm pixel, slit width 15 µm) = 0.02 nm, repeatability = ±0.007 nm, wavelength accuracy = ±0.034 nm, average scanning step = 0.0017 nm.
Grating Echelle, 75 l/mm, λ = 200 nm, 120 order: reciprocal linear dispersion = 0.055 nm/mm, spectral resolution of PMT (slit width 10 µm) = 0.0008 nm, spectral resolution of digital camera (12 µm pixel, slit width 15 µm) = 0.0011 nm, repeatability = ±0.0009 nm, wavelength accuracy = ±0.0045 nm, scanning step at 200 nm = 2.25 х 10^-4nm.

Size of grating:	80 х 70 х 10 mm
Rotation method:	about the center of grating working surface
Mounting of gratings in models MS7504 and MS7504i:	automated 4-grating turret
Mounting of gratings in models MS7501 and MS7501i:	positioner for 1 manually changeable grating
Grating repeatability for the automated 4-grating turret (models MS7504 and MS7504i):
wavelength*:	± 0.03 nm
vertical image:
typical	± 35 µm
maximal	± 50 µm
Grating repeatability for 1 manually changeable grating (models MS7501 and MS7501i):
wavelength*:	± 0.05 nm
vertical image:	± 50 µm

Size of grating: 80 х 70 х 10 mm.
Rotation method: about the center of grating working surface.
Mounting of gratings in models MS7504 and MS7504i: automated 4-grating turret.
Mounting of gratings in models MS7501 and MS7501i: positioner for 1 manually changeable grating.
Grating repeatability for the automated 4-grating turret (models MS7504 and MS7504i): wavelength* = ±0.03 nm; vertical image: typical = ±35 µm; maximal = ±50 µm.
Grating repeatability for 1 manually changeable grating (models MS7501 and MS7501i): wavelength* = ±0.05 nm; vertical image = ±50 µm.

Control:	automated (drive) or manual (micrometer)
Width:	regulated from 0 up to 2.0 mm
Parallelism:	± 1 µm
Accuracy (slit 1 mm):	± 10 µm
Repeatability:	± 1 µm (± 1.5 µm – manual slit)
Reading accuracy (micrometer):	2 µm
Step size (automated slit):	0.5 µm
Height:	from 0 up to 10 mm diaphragm-regulated

Number of ports:	1 input, 2 output
Output port repeatability (automated mirror):	± 0.01 nm
Switching time (output port):	10 s

Shut time:	~100 ms
Maximal frequency:	1 Hz
Control:	on-board CPU or TTL-signals from the external device

Overall sizes (L х W х H):	950 х 361 х 343 mm
Weight:	45 kg (may vary, depends on configuration)

* The characteristics are given for grating 1200 lines/mm, slit width 15 μm, wavelength 546 nm.